Psychological Test, The Terman Record Form for the Stanford Revision of the Binet-Simon Tests

Psychological Test, The Terman Record Form for the Stanford Revision of the Binet-Simon Tests

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In 1908, the Frenchmen Alfred Binet and Theodore Simon published a scale for measuring the intelligence of individual children. The device much interested Louis Terman, a professor at the Los Angeles State Normal School who would soon move to Stanford University, and he began studies of children whose intellect ranked high according to the Binet-Simon scale. He revised the scale, and prepared a new form of the test. This record form describes the questions to be asked of children and leaving space for their responses. It first appeared in 1916 – this example was copyrighted by Houghton Mifflin Company in 1916, 1922 and 1934.
Compare 1990.0034.025, 1990.0034.026, and 1990.0034.027.
Boring, E.G., “Lewis Madison Terman 1877-1956,” Biographical Memoirs of the National Academy of Sciences, 1959.
Carson, J., The Measure of Merit: Talents, Intelligence, and Inequality in the French and American Republics, Princeton: Princeton University Press, 2007.
Currently not on view
Object Name
Psychological Test
date made
ca 1934
Houghton Mifflin Company
Physical Description
paper (overall material)
overall:.1 cm x 20.8 cm x 28.3 cm; 1/32 in x 8 3/16 in x 11 5/32 in
ID Number
catalog number
accession number
Credit Line
Gift of Samuel Kavruck
Psychological Tests
See more items in
Medicine and Science: Mathematics
Science & Mathematics
Data Source
National Museum of American History
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